Author(s): Kim, J B, Fuentes-Hernandez, C, Hwang, D K, Potscavage Jr, W J, Cheun, H and Kippelen, B
Published: 2011
Web link: http://linkinghub.elsevier.com/retrieve/pii/S156611991000337X
UV-assisted room-temperature gas sensing by HfO2 thin films
Author(s): Karaduman, Irmak, Barin, �zlem and Acar, Selim
Published: 2016
Author(s): Xu, Q, Yang, Y., Wang, X, Wang, Z, Jin, W and Huang, J.
Published: 2012
Web link: http://www.sciencedirect.com/science/article/pii/S0376738812004152
Author(s): Greenberg, Benjamin L, Ganguly, Shreyashi, Held, Jacob T, Kramer, Nicolaas J, Mkhoyan, K Andre, Aydil, Eray S and Kortshagen, Uwe R
Published: 2015
Web link: http://pubs.acs.org/doi/10.1021/acs.nanolett.5b03600
Metal oxide semiconductor structure using oxygen-terminated diamond
Author(s): Chicot, G, Mare?chal, A, Motte, R, Muret, P, Gheeraert, E and Pernot, J
Published: 2013
Web link: http://link.aip.org/link/APPLAB/v102/i24/p242108/s1&Agg=doi
Failure analysis of MIM and MIS structures using spatial statistics
Author(s): Miranda, E.
Published: 2013
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Author(s): Sharma, M, Pudasaini, P R and Ruiz-Zepeda, F
Published: 2014
(Invited) Electrical and Physical Properties of High-k Gate Dielectrics on InxGa1-xAs
Author(s): Vogel, E, Sonnet, A, Galatage, R and Milojevic, M
Published: 2010
Author(s): Klahr, Benjamin M and Hamann, Thomas W
Published: 2009