The Effect of HfO2 Overlayer on the Thermal Stability of SiGe Substrate
Author(s): Michaelson, S, Akhvlediani, R, Milshtein, I, Hoffman, A, Meyler, B, Salzman, J, Lipp, E, Shima-Edelstein, R and Roizin, Y
Published: 2012
Zinc oxide grown by atomic layer deposition – a material for novel 3D electronics
Author(s): Guziewicz, El?bieta, Godlewski, Marek, Krajewski, Tomasz A, Wachnicki, ?ukasz, ?uka, Grzegorz, Domaga?a, Jaros?aw Z, Paszkowicz, Wojciech, Kowalski, Bogdan J, Witkowski, Bart?omiej S, Du?y?ska, Anna and Suchocki, Andrzej
Published: 2010
Design of active and stable oxygen reduction reaction catalysts by embedding Co
Author(s): Yang, F and Rogero, Celia
Published: 2016
Approach for Al2O3 rear surface passivation of industrial p-type Si PERC above 19%
Author(s): Vermang, Bart, Goverde, Hans, Tous, Loic, Lorenz, Anne, Choulat, Patrick, Horzel, Jorg, John, Joachim, Poortmans, Jef and Mertens, Robert
Published: 2012
Web link: http://doi.wiley.com/10.1002/pip.2196
Encapsulation of Zinc Tin Oxide Based Thin Film Transistors
Author(s): G�rrn, Patrick, Riedl, Thomas and Kowalsky, Wolfgang
Published: 2009
Author(s): Yang, Yingchao: Liang, Xin: Chen, Weibing: Cao, Linlin: Li, Minglin: Sheldon, Brian W: Lou, Jun
Published: 2015
Web link: http://linkinghub.elsevier.com/retrieve/pii/S0008622315302050
Growth of vertically aligned ZnO nanorods using textured ZnO films
Author(s): Sol�s-Pomar, Francisco, Mart�nez, Eduardo, Mel�ndrez, Manuel F and P�rez-Tijerina, Eduardo
Published: 2011
Thin dielectric films grown by atomic layer deposition: Properties and applications
Author(s): Campabadal, F, Raf�, J M, Gonzalez, M B, Zabala, M, Beldarrain, O, Acero, M C and Duch, M
Published: 2013
Web link: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6481327' escapeXml='false'/>
Author(s): Saura, X: Monaghan, S.: Hurley, P K: Su��, J: Miranda, E.
Published: 2014
Web link: http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6953206
Author(s): Hoffeditz, William L, Katz, Michael J, Deria, Pravas, Martinson, Alex B F, Pellin, Michael J, Farha, Omar K and Hupp, Joseph T
Published: 2014