Author(s): Ahn, Jong Hyun, Zhu, Zhengtao, Park, Sang Il, Xiao, Jianliang, Huang, Yonggang and Rogers, John A
Published: 2008
Hall Effect, DLTS and CV Characterization of ALD HfO2 and ZnO Thin Films
Author(s): Tapily, K, Apparaju, S, Rozgonyi, G and Gu, D
Published: 2010
Web link: http://ma.ecsdl.org/content/MA2010-02/22/1552.short
Surface passivation and optical characterization of Al2O3/a-SiCx stacks on c-Si substrates
Author(s): L�pez, G, Ortega, P R, Voz, C and Mart�n, I
Published: 2013
Web link: http://www.beilstein-journals.org/bjnano/content/4/1/82/abstract
Ge p-MOSFETs With Scaled ALD< formula formulatype=
Author(s): Henkel, C, Abermann, S and Bethge, O
Published: 2010
Web link: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5610718
Author(s): Mohseni, H. and Scharf, T. W.
Published: 2012
Author(s): Vermang, Bart, Rothschild, Aude, Kenis, Karine, Wostyn, Kurt, Bearda, Twan, Racz, A., Loozen, X, John, Joachim, Mertens, Paul W, Poortmans, Jef and Mertens, Robert P
Published: 2012
Web link: http://www.scientific.net/SSP.187.357
Novel Self-shrinking Mask for Sub-3?nm Pattern Fabrication
Author(s): Yang, Po-Shuan, Cheng, Po-Hsien, Kao, C Robert and Chen, Miin-Jang
Published: 2016
Web link: http://www.nature.com/articles/srep29625
Individual copper nanowire decorated by gold nanoparticles for Surface enhanced Raman scattering
Author(s): Guttikonda, R
Published: 2009
Web link: http://digitalscholarship.unlv.edu/thesesdissertations/133/
Author(s): Sonnet, A M, Galatage, R V, Hurley, P K and Pelucchi, E
Published: 2011
Web link: http://www.sciencedirect.com/science/article/pii/S0167931711003790
Author(s): Yao, Xiahui, Cheng, Qingmei, Xie, Jin, Dong, Qi and Wang, Dunwei
Published: 2015